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model number
AFM1000
brand name
NANBEI
place of origin
Henan, China
customized support
OEM
warranty
1 year
Product name
afm tip contact mode probes atomic force microscope price
Scanning Resolution: A resolution of 0.2nm in XY direction and 0.05nm in Z direction allows for highly detailed and precise surface imaging, essential for accurate nanoscale analysis.
Scanning Range: With a scanning range of 20mm in XY direction and 2mm in Z direction, the microscope can cover a wide area, making it suitable for comprehensive sample analysis.
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