Application
Count
Data Cache
-
Display Type
-
Power Source
24V AC
Place of Origin
Japan
Model Number
P10 Falling dust counter
ISO 14644-9 Compliance: Ensures the device meets international standards for surface cleanliness, providing reliable and standardized measurements.
Minimum Measurable Size 10 µm: Allows for the detection of coarse particles, which are critical in identifying defect causes from dust and foreign particles in cleanroom environments.
Supported Wafer Sizes: Supports 4-inch and 2-inch wafers, allowing for versatile use in different semiconductor and cleanroom applications.
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